Overview
Reduce Test Time Up To 3X with the Cadence Modus DFT Software Solution
Concerned about escalating test costs? Reduce your SoC test time by up to 3X with the Cadence Modus DFT Software Solution. This next-generation tool features a new patented 2D Elastic Compression architecture, enabling compression ratios beyond 400X without impacting design size or routing. With a complete suite of industry-standard capabilities for memory BIST, logic BIST, test point insertion, and diagnostics, the solution can help you reduce your production test costs and increase silicon profit margins.
Key Benefits
The Most Productive Design for Test Solution for Achieving High Coverage, Reduced Test Time, and Superior PPA
Complete, Integrated DFT Solution
Natively integrated with the Genus Synthesis Solution or standalone DFT insertion
Compression Optimization
Up to 2.6X reduction in compression logic wirelength—resolves routing congestion issues due to traditional scan compression logic
Innovus Test Points
Unique solution enables maximum coverage and test point sharing with no degradation in PPA
Intelligent Diagnostics
Highest accuracy and resolution diagnostics—faster, smarter insight into yield issues
Features
A Complete DFT Solution Integrated with Physical Design to Achieve High Coverage While Reducing Test Time and Delivering Superior PPA
Customer Success
Learn how customers use Cadence Modus to reduce test times while automating processes.
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Customer Stories
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Resources
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On-Demand CadenceTECHTALK
What’s New— Enhanced Design Features with Cadence Modus DFT, ATPG, and Diagnostics
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Article
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