AI-Driven EM-IR Design Closure

In this webinar, we will present an AI-driven EM-IR closure solution integrated into the implementation flow. This solution uses AI methods to automatically root cause IR drop violations and selects the most efficient PPA- and DRC-aware methods to fix IR drop issues. The solution also uses AI models to enable fast incremental IR inferencing to validate the benefit of the design improvements. Come learn about this breakthrough solution that will significantly improve your IR drop closure TAT.