Overview
Meet Reliability Challenges for Mission-Critical Applications
Mission-critical circuits in applications such as automotive, medical, industrial, and aerospace must perform longer and more reliably across different conditions. The Cadence Legato Reliability Solution integrates into the best-in-class Cadence Virtuoso and Spectre technologies, enabling transistor-level analog reliability verification for product lifespan, temperature and thermal propagation, and defect test coverage.
The Legato Reliability Solution includes aging simulation to predict device degradation, electrothermal simulation powered by Cadence Celsius Thermal Solver to measure the impact of heat propagation, and analog fault simulation to optimize manufacturing test coverage and meet functional safety requirements such as ISO 26262.
Key Benefits
Minimize Field Failures and Achieve Certification Faster
Achieve Reliability Goals Efficiently
Leverage Spectre Simulation Platform’s performance scalability to deliver fast turnaround times
Reduce Product Development and Verification Costs
Minimize late-stage design iterations, engineering delays, product iterations, and field failures
Faster Functional Safety Certification
Part of the ISO 26262-certified Cadence AMS Design and Verification Tool Chain for safety-related product development
Easy Adoption
Built on Virtuoso Studio and Spectre Simulation Platform for ease of use and to simplify technology adoption
Offerings
Enabling Comprehensive Reliability Verification
Advanced Aging Simulation
Devices in mission-critical applications need to maintain their functionality and performance over their expected operating life, which could be 15 years or more. The Legato Reliability Solution’s advanced aging simulation supports foundry device degradation models and provides industry-leading device degradation modeling capability, enabling accurate prediction of circuit functionality and performance changes over operating lifetime.
Benefits
Electrothermal Simulation
Thermally sensitive applications such as automotive and power management designs need detailed analysis of heat impact and propagation. Self-heating simulations do not consider heat propagation, where a high-power density device can increase the ambient temperature of neighboring circuits and impact circuit performance. The Legato Reliability Solution’s electrothermal simulation leverages the Celsius Thermal Solver for thermal extraction and dynamically runs a transistor-level simulation to ensure designs meet target metrics while including the impact of temperature gradients on device behavior.
Benefits
Analog Fault Simulation
Detection of manufacturing defects is critical to prevent defective parts from entering the supply chain. Also, for automotive and other safety-critical applications, it is a critical requirement to achieve high diagnostic coverage. Transistor-level analog fault simulation in the Legato Reliability Solution provides a systematic approach to defect simulation and test/diagnostic coverage, reducing the threat of test escapes, ensuring compliance with functional safety standards, and optimizing post-manufacturing test time and cost.
Benefits
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